Leach R. Advances in Optical Surface Texture Metrology 2020

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Leach R. Advances in Optical Surface Texture Metrology 2020 (Size: 43.02 MB)
  Leach R. Advances in Optical Surface Texture Metrology 2020.pdf 43.02 MB

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Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis
Terms and definitions
Coherence scanning interferometry
Focus variation
Imaging confocal microscopy
Non-scanning techniques
Scattering approaches
In-process surface topography measurements

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